Lunch & Learn - AFM/Raman: Multi-technique Analysis at the Nanoscale

Price: Conferee: $25; Student: $15; Non-Conferee: $35
Date: October 9 / 11:00 am - 1:00 pm
Instructors: Andrey Krayev, Maruda Shanmugasundaram and Marc Chaigneau, HORIBA Scientific

At the nanoscale, materials exhibit substantially different properties than at the macro level. The characterization of nanomaterials requires imaging techniques with resolution at the same scale or better so that local property variations can be discerned, and defects properly detected.

The NanoRaman platform allows fully-integrated use of Raman and AFM for Tip-Enhanced Optical Spectroscopies (such as Tip-Enhanced Raman Scattering (TERS) and PhotoLuminescence (TEPL)), but also for truly co-localized AFM/Raman measurements, thus providing perfectly-correlated physical and chemical nanoscopic information. This platform can address applications in Life Sciences (amino acids, nucleobases, cells) and in Material Sciences (1D, 2D materials, polymers, organic molecules, semiconductors).

During this workshop, the NanoRaman instrumentation will be presented and live demonstrations of nanoscale imaging of 2D semiconductors will be performed. We will be happy to discuss samples provided by attendees as well as schedule one-on-one demonstrations.  

Lunch will be served during this workshop.